List of Publications of Matthias Patz

  1. Structure of Cryptade (2.1.1) Dihydrochloride Dihydrate at 120 K
    J. Buschmann, A. Knöchel, D. Tiemann, M. Patz,
    Acta Crystallogr. Sect. C: Cryst. Struct. Commun. 1991, C47, 1860-1863.

  2. Low-Temperature X-ray and Neutron Diffraction Studies on 18-Crown-6 . 2 Cyanamide including Electron Density Determination
    J. Buschmann, L. Denner, P. Luger, A. Knöchel, M. Haarich, M. Patz,
    J. Am. Chem. Soc. 1991, 113, 8388-8398.

  3. How Nucleophilic Are Silyl Enol Ethers? Kinetics of the Reactions of Electron Rich CC-Double Bonded Systems with Carbenium Ions
    M. Patz, H. Mayr
    Tetrahedron Lett. 1993, 34, 3393-3396.

  4. Scales of Nucleophilicity and Electrophilicity: A System for Ordering Polar Organic and Organometallic Reactions
    H. Mayr, M. Patz
    Angew. Chem. 1994, 106, 990-1010; Angew. Chem. Int. Ed. Engl. 1994, 33, 938-957.

  5. Experimental Charge Density Study on an Ionic Crown Ether Complex: [Kc18-Crown-6]+ N3- . H2O
    T. Koritsanszky, P. Luger, A. Knöchel, M. Patz,
    J. Am. Chem. Soc. 1994, 116, 6748-6756.

  6. Common Origin of Enthalpic and Entropic Substituent Effects in Reactions of Benzhydryl Cations with Nucleophiles
    M. Patz, H. Mayr, J. Bartl, S. Steenken
    Angew. Chem. 1995, 107, 519-521; Angew. Chem. Int. Ed. Engl., 34, 490-492.

  7. Kinetics of Electrophile-Nucleophile Combination Reactions: Systematic Design of Organic Synthesis via Cationic Electrophiles
    H. Mayr, M. Patz
    in: Frontiers of Studies on Organic Reaction Mechanisms (Ed.: T. Okuyama, S. Tomoda, H. Yamataka), Tokyo Kagaku Dojin, 1995, p. 33-43.

  8. Reactions of Carbocations with p-Nucleophiles: Polar Mechanism and No Outer Sphere Electron Transfer
    M. Patz, H. Mayr, J. Maruta, S. Fukuzumi
    Angew. Chem. 1995, 107, 1351-1353; Angew. Chem. Int. Ed. Engl. 1995, 34, 1222-1225.

  9. Electrophilic Reactions of the Dibenzo[a,d]tropylium Ion
    J. Henninger, H. Mayr, M. Patz, M. D. Stanescu
    Liebigs Ann. 1995, 2005-2009.

  10. Kinetics of Carbocationic Polymerization: Initiation, Propagation and Transfer Step.
    H. Mayr, G. Lang, M. Roth, M. Patz
    Polymer Preprints 1996, 37, 353-354.

  11. Modelling Carbocationic Polymerizations: Kinetics of the Reactions of Carbocations with Alkenes
    H. Mayr, M. Patz,
    Makromol. Chem., Macromol. Symp. 1996, 107, 99-110.

  12. Electron Transfer in Organic Chemistry
    M. Patz, S. Fukuzumi
    J. Phys. Org. Chem. 1997, 10, 129-137.

  13. Oxidation Mechanism of NADH Dimer Model Compounds
    M. Patz, Y. Kuwahara, T. Suenobu, S. Fukuzumi
    Chem. Lett. 1997, 567-568.

  14. Living Oligomerization of Isobutylene Using Di- and Triisobutylene Hydrochlorides as Initiators
    M. Roth, M. Patz, H. Freter, H. Mayr
    Macromolecules 1997, 300, 722725.

  15. Photoreduction of C60 with NADH and NAD Dimer Analogs via Electron Transfer
    S. Fukuzumi, M. Patz, T. Suenobu, A. Ishida, K. Mikami
    In: Fullerenes: Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, ed by R. S. Ruoff and K. M. Kadish, The Electrochemical Society, Inc., Pennington, NJ (1997), Vol. 4, 45-55.

  16. Linear free enthalpy relationships: a powerful tool for the design of organic and organometallic synthesis
    Herbert Mayr, Oliver Kuhn, Matthias F. Gotta and Matthias Patz
    J. Phys. Org. Chem. 1998, 11, 642-654.

  17. Selective One-Electron and Two-Electron Reduction of C60 with NADH and NAD Dimer Analogues via Photoinduced Electron Transfer
    Shunichi Fukuzumi, Tomoyoshi Suenobu, Matthias Patz, Takeomi Hirasaka, Shinobu Itoh, Mamoru Fujitsuka, Osamu Ito
    J. Am. Chem. Soc. 1998, 120, 8060-8068.

  18. Reactivities and Selectivities of Free and Metal-Coordinated Carbocations
    H. Mayr, M. Patz, M. F. Gotta, A. R. Ofial
    Pure Appl. Chem. 1998, 70, 1993-2000.

  19. Determination of the Nucleophilicities of Silyl and Alkyl Enol Ethers
    J. Burfeindt, M. Patz, M. Müller, H. Mayr
    J. Am. Chem. Soc. 1998, 120, 3629-3634.

  20. ESR Spectra of Superoxide Anion-Scandium Complexes Detectable in Fluid Solution
    S. Fukuzumi, M. Patz, T. Suenobu, Y. Kuwahara, S. Itoh
    J. Am. Chem. Soc. 1999, 121, 1605-1606.

  21. Soluble Mainchain Polyoxadiazoles as Electron Transport Material
    M. Patz, M. Takahashi, K. Goto
    Polym. J. 2000, 32, 516-519.

  22. Thermally Stable Polyarylenes with Low Dielectric Constant: Direction towards the Lowest Limit of Dielectrics
    K. Goto, T. Akiike, K. Konno, T. Shiba, M. Patz, M. Takahashi, Y. Inoue, M. Matsubara
    J. of Photopolymer Science and Technology 2002, 5, 223-230.

  23. Adhesion studies of thin films on ultra low k
    S. Maitrejean, F. Fusalba, M. Patz, V. Jousseaume, T. Mourier
    Proceedings of the IITC, 2002, 27-29.

  24. Material Modification of the Patterned Wafer during Dry Etching and Strip Determined by XPS
    Y. Furukawa, M. Patz, T. Kokubo, J. H. M. Snijders
    Microelectronic Engineering, 2003, 70, 267-273.

  25. Impact of LKD5109 low-k to Cap/Liner Interfaces in Single Damascene Process and Performance
    F. Iacopi, M. Patz, I. Vos, Zs. Tokei, B. Sijmus, Q. T. Le, E. Sleeckx, B. Eyckens, H. Struyf, A. Das, K. Maex
    Microelectronic Engineering, 2003, 70, 293-301.

  26. Characterisation of JSR's spin-on hardmask FF-02
    A. Das , Q. T. Lea, Y. Furukawa, V. H. Nguyen, V. Terzieva, F. de Theije, C. M. Whelan, M. Maenhoudt, H. Struyf, Zs. Tokei, F. Iacopi, M. Stucchi, L. Carbonell, I. Vos, H. Bender, M. Patz, G. Beyer, M. Van Hove, K. Maex
    Microelectronic Engineering, 2003, 70, 308-313.

  27. Understanding Adhesion Failure in Low-k Dielectric Stack During Chemical-Mechanical Polishing
    F. Iacopi, D. Degryse, I. Vos, M. Patz, K. Maex
    MRS Proceedings 2003, 795, U4.3.

  28. Linewidth-narrowing due to 193 nm resist deformation during etch of spin-on low-k dielectrics
    Y. Furukawa, R. Wolters, M. Patz
    Proceedings of the IITC, 2003,150-151.

  29. Interaction of a Variety of Ashing Plasma with MSQ low-k Dielectric
     Q. Le, M. Patz, H. Struyf, M. Baklanov, W. Boullart, S. Vanhaelemeersch, K. Maex
    Extended Abstracts of the 205th Meeting of the Electrochemical Society, 2004, 140.

  30. Correlation between Barrier Integrity and TDDB Performance of Copper Porous low-k Interconnects
    Zs. Tokei, M. Patz, M. Schmidt, F. Iacopi, S. Demuynck, K. Maex
    Microelectronic Engineering, 2004, 76, 70-75.

  31. Correlation between Solvent Diffusion, Porosity and Pore Sealing for low k Dielectrics
    T. Abell, D. Shamiryan, M. Patz, M., K. Maex
    Advanced Metallization Conference, 2004, 549-553.

  32. Evaluation of Gas Cluster Ion Beam Processing for Sealing of a Porous Dielectric
    S. H. Brongersma, S. Sherman, M. Tabat, M. Patz, G. Beyer, Y. Travaly, T. Q. Le, R. Caluwaerts, J. Hautala
    Conference Proceedings AMC, 2004, 457-462.

  33. Fracture of Nanoporous Methyl Silsesquioxane Thin-Film Glasses
    E. P. Guyer, M. Patz, R. H. Dauskardt
    J. Mater. Res, 2006, 21, 882-894.

  34. Influence of Process Parameters on Leakage Current of HfSiOx Dielectrics
    A. Avellan, M. Patz, E. Erben, A. Ivanov, S. Kudelka
    ECS Trans., 2006, 3, 882-894.

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